Stern RFID Attendance Records

Stern Information Technology provides a way to view your RFID attendance records in AIS http://ais.stern.nyu.edu/. For information on using the RFID tags, please view the brochure.

Login to AIS

1. Login to http://ais.stern.nyu.edu/. Your username and password are the same as for your Stern email account.

View Attendance Records

1. Click on Attendance Pilot link on bottom of left sidebrochure bar navigation, as shown below.

Select your Course

1. Under Course Selection click B01.1306.01.

View/Appeal Absences

1. The dates that you are recorded as absent will appear in the central window. To appeal a recorded absence, click on the date of the absence, as shown below.

2. Cick on the drop-down arrow to view the list of reasons for appeal.

3. Select a reason from the list.

4. Click on Submit Appeal. You will then see the following confirmation screen. The Faculty member will respond to your appeal via email.